年度 | 2011 |
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全部作者 | 邱一 |
论文名称 | “Characterization of a burn-in failure caused by a defective source driver on TFT-LCD panel,” FSC Wang, K-L. Lin, K-Y. Tso, C-C. Chao, WW Wang, A. Yu, C-Y. Lee, C-H. Kuo, CWA Wang, Y. Chiu, 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, Singapore, 171-4 (2006). |
发表日期 | 2011-07-26 |