年度	2011
全部作者	苏朝琴
论文名称	C.C. Su, K.C. Hwang, and S.J. Jou, ``An IDDQ Based Built-in Concurrent Test Technique for Interconnects in a Boundary Scan Environment," Proc. IEEE Int'l Test Conference, Washington DC USA, Oct. 1994, pp.670-676.
发表日期	2011-07-20