Year	2011
Authors	Li, Yiming
Paper Title	Fu-Liang Yang, Jiunn-Ren Hwang, and Yiming Li, “Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices,” Proceedings of The 2006 IEEE Custom Integrated Circuits Conference (IEEE CICC 2006), San Jose, California, U.S.A., Sept. 10-13, 2006, pp. 691-694.
Date of Publication	2011-08-01