年度 | 0000 |
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全部作者 | 李義明 |
論文名稱 | Yiming Li, Shao-Ming Yu, and Ching-Feng Hsiao,, "Study of Threshold Voltage Fluctuations of Nanoscale Double Gate Metal-Oxide-Semiconductor Field Effect Transistors Using Quantum Correction Simulation,", Accepted by the 15th edition of the Workshop on the Modeling and Simulation of Electron Devices (MSED 2005), Polo Carmignani, Università di, Pisa, Italy, 2005年07月 |
發表日期 | 1970-01-01 |