Year 2011
Authors Su, Chau-Chin
Paper Title

S.M. Li, Y.W. Chang, C.L. Lee, C.C. Su, and J.E. Chen, “Multilevel Full-Chip Routing
With Testability and Yield Enhancement,” IEEE Trans. On Computer-Aided Design of
Integrated Circuits and Systems, Vol. 26, Issue. 9, Sept. 2007, pp. 1625-1636.
Date of Publication 2011-07-20