年度 | 2011 |
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全部作者 | 蘇朝琴 |
論文名稱 | C.C. Su, Y.T. Chen, and S.J. Jou, "Intrinsic Response for Analog Module Testing Using Analog Testability Bus," ACM Transcations on Design Automation of Electronic Systems , Vol. 6, No.2, April 2001, pp.226-243 (full paper). (SCI) |
發表日期 | 2011-07-20 |