年度	2011
全部作者	蘇朝琴
論文名稱	C.C. Su, Y.T. Chen, and S.J. Jou, "Intrinsic Response for Analog Module Testing Using Analog Testability Bus," ACM Transcations on Design Automation of Electronic Systems , Vol. 6, No.2, April 2001, pp.226-243 (full paper). (SCI)
發表日期	2011-07-20