年度 2011
全部作者 苏朝琴
论文名称 C.C. Su, Y.T. Chen, and S.J. Jou, "Intrinsic Response for Analog Module Testing Using
Analog Testability Bus," ACM Transcations on Design Automation of Electronic Systems ,
Vol. 6, No.2, April 2001, pp.226-243 (full paper). (SCI)
发表日期 2011-07-20