Year	2011
Authors	Su, Chau-Chin
Paper Title	C.C. Su and Y.T. Chen, "Intrinsic Response Extraction for the Analog Test Bus Parasitic Effect Removal," IEEE Trans. On CAD, IEEE Trans. On Computer-Aided Design of Integrated Circuits, Vol. 19, No. 4, April 2000, pp.437-445 (full paper). (SCI)
Date of Publication	2011-07-20