年度	2011
全部作者	苏朝琴
论文名称	C.C. Su and Y.T. Chen, "Intrinsic Response Extraction for the Analog Test Bus Parasitic Effect Removal," IEEE Trans. On CAD, IEEE Trans. On Computer-Aided Design of Integrated Circuits, Vol. 19, No. 4, April 2000, pp.437-445 (full paper). (SCI)
发表日期	2011-07-20