年度 2011
全部作者 蘇朝琴
論文名稱 C.W. Lu, C.L. Lee, C.C. Su and J.E. Chen, “Analysis of Application of IDDQ Technique to
the Deep Submicron VLSI Testing,” Journal of Electronic Testing Technology and
Applications (JETTA), 18, pp.89-97, 2002. (SCI)
發表日期 2011-07-20