Year	2011
Authors	Su, Chau-Chin
Paper Title	C.W. Lu, C.L. Lee, C.C. Su and J.E. Chen, “Analysis of Application of IDDQ Technique to the Deep Submicron VLSI Testing,” Journal of Electronic Testing Technology and Applications (JETTA), 18, pp.89-97, 2002. (SCI)
Date of Publication	2011-07-20