Year 2011
Authors Su, Chau-Chin
Paper Title C.W. Lu, C.L. Lee, C.C. Su and J.E. Chen, “Analysis of Application of IDDQ Technique to
the Deep Submicron VLSI Testing,” Journal of Electronic Testing Technology and
Applications (JETTA), 18, pp.89-97, 2002. (SCI)
Date of Publication 2011-07-20