年度 2011
全部作者 苏朝琴
论文名称 C.W. Lu, C.L. Lee, C.C. Su and J.E. Chen, “Analysis of Application of IDDQ Technique to
the Deep Submicron VLSI Testing,” Journal of Electronic Testing Technology and
Applications (JETTA), 18, pp.89-97, 2002. (SCI)
发表日期 2011-07-20