年度	2011
全部作者	苏朝琴
论文名称	C.W. Lu, C.L. Lee, C.C. Su and J.E. Chen, “Analysis of Application of IDDQ Technique to the Deep Submicron VLSI Testing,” Journal of Electronic Testing Technology and Applications (JETTA), 18, pp.89-97, 2002. (SCI)
发表日期	2011-07-20