年度 | 2011 |
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全部作者 | 苏朝琴 |
论文名称 | C.W. Lu, C.L. Lee, C.C. Su and J.E. Chen, “Analysis of Application of IDDQ Technique to the Deep Submicron VLSI Testing,” Journal of Electronic Testing Technology and Applications (JETTA), 18, pp.89-97, 2002. (SCI) |
发表日期 | 2011-07-20 |