| Year | 2010 |
|---|---|
| Authors | Chen, Ke-Horng 、Shao-Chang Huang、Ke-Horng Chen、Hsin-Ming Chen、Michael Ho、and Shih-Jye Shen |
| Paper Title | ESD Avoiding Circuits for Solving OTP Memory Falsely Programmed Issues |
| Journal Title | IEEE CAS Magazine |
| Vol.No | Vol. 10 |
| Issue.No | Issue 2 |
| From | 30 |
| To | 39 |
| Language | English |