Year | 2011 |
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Authors | Li, Yiming |
Paper Title | "Yiming Li and Wei-Hsin Chen, “Effect of Fin Angle on Electrical Characteristics of Nanoscale Bulk FinFETs,” Proceedings of The 2006 NSTI Nanotechnology Conference and Trade Show (NSTI Nanotech 2006), Boston, Massachusetts, U.S.A., May 7-11, 2006, Vol. 3, pp. 20-23. " |
Date of Publication | 2011-08-01 |