Year	2011
Authors	Li, Yiming
Paper Title	Chia-Hui Yu, Ming-Hung Han, Hui-Wen Cheng, Zhong-Cheng Su, Yiming Li and Hiroshi Watanabe,“Statistical Simulation of Metal-Gate Work-Function Fluctuation in High-K/Metal-Gate CMOS Devices,”Proceedings of IEEE 15th International Conference on Simulation of Semiconductor Processes and Devices (IEEE SISPAD 2010), Bologna, Italy, Sep. 6-8, 2010, pp. 153-156.
Date of Publication	2011-08-01