Year	2011
Authors	Li, Yiming
Paper Title	Chih-Hong Hwang, Hui-Wen Cheng, Ta-ChingYeh, Tien-Yeh Li, Hsuan-Ming Huang and Yiming Li,“Comprehensive Examination of Threshold Voltage Fluctuations in Nanoscale Planar MOSFET and Bulk FinFET Devices,” Proceedings of The 2008 NSTI Nanotechnology Conference and Trade Show (NSTI Nanotech 2008), Boston, Massachusetts, June 1-5, 2008, Vol. 3, pp. 647-650.
Date of Publication	2011-08-01