Year	2011
Authors	Li, Yiming
Paper Title	Chih-Hong Hwang, Ming-Hung Han, and Yiming Li, “Statistical Reliability in FinFET Devices with Intrinsic Parameter Fluctuations,” Proceedings of The 2009 International Electron Devices and Materials Symposia (IEDMS 2009), Chang Gung University, Kweishan, Taiwan, Nov. 19-20, 2009, pp.705-706.
Date of Publication	2011-08-01