Year 2011
Authors Li, Yiming
Paper Title Chih-Hong Hwang, Ming-Hung Han, and Yiming Li, “Statistical Reliability in FinFET Devices with Intrinsic Parameter Fluctuations,” Proceedings of The 2009 International Electron Devices and Materials Symposia (IEDMS 2009), Chang Gung University, Kweishan, Taiwan, Nov. 19-20, 2009, pp.705-706.
Date of Publication 2011-08-01