Year 2011
Authors Li, Yiming
Paper Title Chih-Hong Hwang, Tien-Yeh Li, Ming-Hung Han, Kuo-Fu Lee, Hui-Wen Cheng, and Yiming Li, “Statistical Analysis of Metal Gate Workfunction Variability, Process Variation, and Random Dopant Fluctuation in Nano-CMOS Circuits,” Proceedings of The 2009 IEEE International Conference on Simulation of Semiconductor Processes and Devices (IEEE SISPAD 2009), Hotel Del Coronado, San Diego, California,USA, Sept. 9-11, 2009, 4pp.
Date of Publication 2011-08-01