Year	2011
Authors	Li, Yiming
Paper Title	Chun-Yen Yiu, Yiming Li, Ming-Hung Han, Kuo-Fu Lee, Thet-Thet Khaing, Hui-Wen Cheng, and Zhong-Cheng Su, “Effect of Intrinsic-Parameter Fluctuations on 16-nm-Gate CMOS and Current Mirror Circuit,” Proceedings of The IEEE 10th International Conference on Nanotechnology (IEEE NANO 2010),Seoul, Korea, Aug. 17-20, 2010, p. ICO_TS07_014 (4pp).
Date of Publication	2011-08-01