Year	2011
Authors	Li, Yiming
Paper Title	Fu-Hai Li, Hui-Wen Cheng and Yiming Li, “Statistical Simulation of Metal-Gate Work-function Fluctuation in High-k / Metal-Gate Devices,” Proceedings of 2010 International Electron Devices and Materials Symposium (IEDMS 2010), Chungli, Taiwan, Nov. 18-19. 2010, p. D4-4.
Date of Publication	2011-08-01