Year 2011
Authors Li, Yiming
Paper Title Hui-Wen Cheng, Chih-Hong Hwang, Chung-Jung Hsieh, and Yiming Li, “Electrical Characteristics Dependence on the Channel Fin Aspect Ratio of Multi-Fin Field Effect Transistors,” Presented in The 2008 International Electron Devices and Materials Symposia (IEDMS), National Chung Hsing University, Taichung, Taiwan, Nov. 28-29, 2008.
Date of Publication 2011-08-01