Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng, Chih-Hong Hwang, and Yiming Li, “Characteristic Sensitivity of Multi-Gate and Multi-Fin MOSFETs to Random Dopant Fluctuation and Implication for Digital Circuits,” Proceedings of The 2009 International Conference on Solid State Devices and Materials (SSDM 2009), Sendai Kokusai Hotel, Miyagi,Japan, Oct. 7-9, 2009, pp. 812-813.
Date of Publication	2011-08-01