Year 2011
Authors Li, Yiming
Paper Title Hui-Wen Cheng, Chih-Hong Hwang and Yiming Li, “Characteristics Dependence on the Vertical Channel Aspect Ratio of Multi-Fin Field Effect Transistors Including Dopant Fluctuation,” Workshop Abstracts of The 2009 IEEE Silicon Nanoelectronics Workshop (IEEE SNW 2009) Kyoto, Japan, June 13-14, 2009, pp.55-56.
Date of Publication 2011-08-01