Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng, Chih-Hong Hwang and Yiming Li, “Electrical Characteristics of Nanoscale Multi-Fin Field Effect Transistors with Different Fin Aspect Ratio,” Proceedings of The 2009 NSTI Nanotechnology Conference and Trade Show (NSTI Nanotech 2009), Houston, Texas, U.S.A., May 3-7, 2009, pp. 609-612.
Date of Publication	2011-08-01