Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng, Chun-Yen Yiu and Thet-Thet Khaing, Yiming Li, “Intrinsic parameter fluctuations on current mirror circuit with different aspect ratio of 16-nm multi-gate MOSFET,” Proceedings of IEEE 2010 Silicon Nanoelectronics Workshop (IEEE SNW 2010), Honolulu, Hawaii, Jun. 13-14, 2010, p. 1-14 (2pp).
Date of Publication	2011-08-01