Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng, Fu-Hai Li, Ming-Hung Han, Chun-Yen Yiu, Chia-Hui Yu, Kuo-Fu Lee, and Yiming Li, “3D Device Simulation of Work-Function and Interface Trap Fluctuations on High-k/Metal Gate Devices,” Proceedings of the 2010 IEEE International Electron Devices Meeting (IEEE IEDM 2010), California, USA, Dec. 6-8, 2010, p. 15-6.
Date of Publication	2011-08-01