Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng, Ming-Hung Han , Yiming Li, Kuo-Fu Lee, Chun-Yen Yiu and Thet-Thet Khaing,“Electrical Characteristic Fluctuation and Suppression in Emerging CMOS Device and Circuit,” Proceedings of IEEE 2010 Silicon Nanoelectronics Workshop (IEEE SNW 2010), Honolulu, Hawaii, Jun. 13-14, 2010, p.1-8 (2pp).
Date of Publication	2011-08-01