Year | 2011 |
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Authors | Li, Yiming |
Paper Title | Hui-Wen Cheng, Ming-Hung Han , Yiming Li, Kuo-Fu Lee, Chun-Yen Yiu and Thet-Thet Khaing,“Electrical Characteristic Fluctuation and Suppression in Emerging CMOS Device and Circuit,” Proceedings of IEEE 2010 Silicon Nanoelectronics Workshop (IEEE SNW 2010), Honolulu, Hawaii, Jun. 13-14, 2010, p.1-8 (2pp). |
Date of Publication | 2011-08-01 |