Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng, Yiming Li, “Metal-gate work-function fluctuation in 16-nm single- and multi-fin field effect transistors with different aspect ratio,” Proceedings of 2010 IEEE International Conference on Semiconductor Electronics (IEEE ICSE 2010), Melaka, Malaysia, Jun. 28-30, 2010, pp. 48-51.
Date of Publication	2011-08-01