Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng and Yiming Li, “16-nm Multigate and Multifin MOSFET Device and SRAM Circuits,”Proceedings of IEEE International Symposium on Next-Generation Electronics (IEEE ISNE 2010),Kaohsiung, Taiwan, Nov. 4-5, 2010, pp. 32-35.
Date of Publication	2011-08-01