Year | 2011 |
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Authors | Li, Yiming |
Paper Title | Hui-Wen Cheng and Yiming Li, “Effect of Process Variation on Physical Characteristics of Nanoscale Multi-Fin Device,” Accepted by The 2008 Conference on Computational Physics (APS CCP2008) Ouro Preto, Brazil, Aug. 5-9, 2008. |
Date of Publication | 2011-08-01 |