Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng and Yiming Li, “Effect of Process Variation on Physical Characteristics of Nanoscale Multi-Fin Device,” Accepted by The 2008 Conference on Computational Physics (APS CCP2008) Ouro Preto, Brazil, Aug. 5-9, 2008.
Date of Publication	2011-08-01