Year | 2011 |
---|---|
Authors | Li, Yiming |
Paper Title | Hui-Wen Cheng and Yiming Li, “Electrical Characteristic Variability in 16-nm Multi-Gate MOSFET Current Mirror Circuit,” Proceedings of IEEE 2010 International Conference on Enabling Science and Nanotechnology (IEEE ESciNano 2010), Kuala Lumpur, Malaysia, Dec. 1-3, 2010, p. P-48. |
Date of Publication | 2011-08-01 |