Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng and Yiming Li, “Electrical Characteristic Variability in 16-nm Multi-Gate MOSFET Current Mirror Circuit,” Proceedings of IEEE 2010 International Conference on Enabling Science and Nanotechnology (IEEE ESciNano 2010), Kuala Lumpur, Malaysia, Dec. 1-3, 2010, p. P-48.
Date of Publication	2011-08-01