Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng and Yiming Li, “Electrical Characteristics of 16-nm-Gate Multi-Gate-and-Multi-Fin 2010/12/25 Prof. Yiming Li’s selected publication list Devices and Digital Circuits,” Proceedings of 2010 NSTI Nanotechnology Conference and Trade Show (NSTI Nanotech 2010), California, USA, Jun. 21-24, 2010, pp. 721-724.
Date of Publication	2011-08-01