Year	2011
Authors	Li, Yiming
Paper Title	Hui-Wen Cheng and Yiming Li, “Random Work Function Variation Induced Threshold Voltage Fluctuation in 16-nm Bulk FinFET Devices with High-k-Metal-Gate Material,” Proceedings of The 14th IEEE International Workshop on Computational Electronics (IEEE IWCE 2010), Pisa, Italy, Oct. 27-29, 2010, pp.331-334.
Date of Publication	2011-08-01