Year 2011
Authors Li, Yiming
Paper Title Hui-Wen Cheng and Yiming Li, “Three-Dimensional Device Simulation of Random Work Function Effect on 16-nm CMOS Devices Induced by Nanosized Grains of Metal Gate,” Proceedings of The 8th International Conference of Computational Methods in Sciences and Engineering (ICCMSE 2010), Kos, Greece, Oct. 3-8,2010, p. 16-1.
Date of Publication 2011-08-01