Year | 2011 |
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Authors | Li, Yiming |
Paper Title | Hung-Ming Chen, Jiunn-Ren Hwang, Yiming Li, and Fu-Liang Yang, “Novel Strained CMOS Devices with STI Stress Buffer Layers,” Accepted by The 2007 IEEE International Symposium on VLSI Technology,System, and Application (IEEE VLSI-TSA 2007), Hsinchu, Taiwan, April 23-25, 2007. |
Date of Publication | 2011-08-01 |