Year | 0000 |
---|---|
Authors | Li, Yiming |
Paper Title | Jam-Wem Lee, Yiming Li, and H. Tang, "Effective Electrostatic Discharge Protection Circuit Design using Novel Full-Silicided N-MOSFETs in Sub-100 nm era,", Proceedings of The Fourth IEEE Conference on Nanotechnology (IEEE NANO 2004), Audimax-TU München, Munich, Germany, August 17-19, 2004, pp. 605-607. , 2004年08月 |
Date of Publication | 1970-01-01 |