Year | 2011 |
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Authors | Li, Yiming |
Paper Title | Kuo-Fu Lee, Chih-Hong Hwang, Tien-Yeh Li, and Yiming Li, “Characteristic Variability of Novel Lateral Asymmetry Nano-MOSFETs Due to Random Discrete Dopants,” Proceedings of The 2009 NSTI Nanotechnology Conference and Trade Show (NSTI Nanotech 2009), Houston, Texas, U.S.A., May 3-7,2009, pp. 602-605. |
Date of Publication | 2011-08-01 |