Year	2011
Authors	Li, Yiming
Paper Title	Kuo-Fu Lee, Chih-Hong Hwang, and Yiming Li, “Random-Dopant-Induced Characteristic Fluctuations of Lateral-Asymmetric-Doping-Profile Nano-MOSFET Device and Circuit,” Presented in The 2008 International Electron Devices and Materials Symposia (IEDMS), National Chung Hsing University,Taichung, Taiwan, Nov. 28-29, 2008.
Date of Publication	2011-08-01