Year	2011
Authors	Li, Yiming
Paper Title	Kuo-Fu Lee, Ming-Hung Han, I-Shiu Lo, Chun-Yen Yiu and Yiming Li, “Characteristic Optimization of Single- and Double-Gate Tunneling Field Effect Transistors,” Proceedings of 2010 NSTI Nanotechnology Conference and Trade Show (NSTI Nanotech 2010), California, USA, Jun. 21-24, 2010, pp. 65-68.
Date of Publication	2011-08-01