Year	2011
Authors	Li, Yiming
Paper Title	Ming-Hung Han and Yiming Li, “Comprehensive Examination of Intrinsic-Parameter-Induced Characteristic Fluctuations in 16-nm-Gate CMOS Devices,” Proceedings of 2010 NSTI Nanotechnology Conference and Trade Show (NSTI Nanotech 2010), California, USA, Jun. 21-24, 2010, pp. 21-24.
Date of Publication	2011-08-01