Year	2011
Authors	Li, Yiming
Paper Title	Thet Thet Khaing, Hui-Wen Cheng, Kuo-Fu Lee, Yiming Li, “Random-dopant-induced DC characteristic fluctuations in 16-nm-Gate LAC and inLAC MOSFET devices,” Proceedings of 2010 IEEE International Conference on Semiconductor Electronics (IEEE ICSE 2010), Melaka, Malaysia, Jun. 28-30, 2010, pp.237-240.
Date of Publication	2011-08-01