Year	2011
Authors	Li, Yiming
Paper Title	Tien-Yeh Li, Chih-Hong Hwang, Ming-Hung Han, and Yiming Li, “Effects of Intrinsic Parameter Fluctuations in Emerging CMOS Technologies,” Workshop Abstracts of The 2009 IEEE Silicon Nanoelectronics Workshop (IEEE SNW 2009) Kyoto, Japan, J June 13-14, 2009, pp. 53-54.
Date of Publication	2011-08-01