Year	2011
Authors	Li, Yiming
Paper Title	Tien-Yeh Li, Chih-Hong Hwang and Yiming Li, “Process- and Random-Dopant-Induced Characteristic Variability of SRAM with nano-CMOS and Bulk FinFET Devices,” Proceedings of The 2009 NSTI Nanotechnology Conference and Trade Show (NSTI Nanotech 2009), Houston, Texas, U.S.A., May 3-7,2009, pp. 586-589.
Date of Publication	2011-08-01