Year 2011
Authors Li, Yiming
Paper Title Yiming Li, Chien-Sung Lu, Wan-Wen Lo, Meng-Jia Tsai, and Tung-Yu Wu, “Sensitivity Analysis of Static Noise Margin in SRAM Cells with 65 nm CMOS Devices,” Book of Abstract of The 6th International Conference of Scientific Computing in Electrical Engineering (SCEE 2006), Sinaia, Romania, 17-22 September 2006, pp. 21-22.
Date of Publication 2011-08-01