Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Chih-Hong Hwang, Hsuan-Ming Huang, and Ta-Ching Yeh, “Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices,” Accepted by The 2007 IEEE International SOI Conference (IEEE SOI 2007), Miramonte Resort and Spa, Indian Wells, California, USA, Oct. 1-4,2007.
Date of Publication	2011-08-01