Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Chih-Hong Hwang, Shao-Ming Yu, and Hsuan-Ming Huang, “Characteristic Fluctuation Dependence on Gate Oxide Thickness Scaling in Nano-MOSFETs,” Workshop Abstracts of The 2007 IEEE Silicon Nanoelectronics Workshop (IEEE SNW 2007) Kyoto, Japan, June 10-11, 2007, pp. 79-80.
Date of Publication	2011-08-01