Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Chih-Hong Hwang, Shao-Ming Yu, and Hsuan-Ming Huang, “Electrical Characteristic Fluctuations in 16nm Bulk-FinFET Devices,” Presented in The IEEE 15th Biannual Conference Insulating Films on Semiconductors (IEEE INFOS 07), Athens, Greece, June 20-23, 2007.
Date of Publication	2011-08-01