Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Chih-Hong Hwang, Shao-Ming Yu, and Hsuan-Ming Huang, “Random Dopant Induced Thermal Fluctuation in Nanoscale SOI FinFET,” Accepted by The 7th IEEE International Conference on Nanotechnology (IEEE-NANO 07), Hong Kong Convention & Exhibition Centre, Hong Kong, China, Aug.2-5, 2007.
Date of Publication	2011-08-01