Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Chih-Hong Hwang, Shao-Ming Yu, and Hsuan-Ming Huang, “Three-Dimensional Simulation of Random-Dopant-Induced Threshold Voltage Fluctuation in Nanoscale Fin-typed Field Effect Transistors,”AIP Conference Proceedings of NOISE AND FLUCTUATIONS: IEEE 19th International Conference on Noise and Fluctuations (IEEE ICNF 2007), Vol. 922, pp. 387-390, 2007.
Date of Publication	2011-08-01