Year	2011
Authors	Li, Yiming
Paper Title	Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, Hui-Wen Cheng, and Tien-Yeh Li Discrete Dopant Fluctuated Transient Behavior in 16-nm-Gate CMOS,” Accepted by The 2008 International Conference on Solid State Devices and Materials (SSDM 2008), Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan, Sept. 23-26, 2008.
Date of Publication	2011-08-01